IEEE Spectrum breed · Technologie

Stop Hunting, Start Solving: Accelerating Root Cause Analysis with Agentic AI

A webinar will focus on how a specialized semiconductor analytics platform can help engineers analyze yield excursions and process issues more effectively by connecting insights across various data domains without needing to move data. It will showcase how Agentic AI, domain-specific visualizations, and push-down compute can speed up investigations, even with billions of data points.

The session will include a live demonstration of a multi-domain root cause investigation using Spotfire® Industry Pro.

Key takeaways include understanding how siloed manufacturing data hinders yield recovery and increases costs, how Agentic AI automates complex cross-domain analytics and visualization generation, and methods for scaling high-performance analytics across large fab datasets.

The webinar is intended for Yield, Process, and Integration Engineers; Fab and Manufacturing Operations Managers; Quality and Reliability Engineers; and Data & Analytics leaders in semiconductor manufacturing who need to identify issues faster and make confident decisions.

AI-samenvatting op basis van de bron.